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Title: Single-frame far-field diffractive imaging with randomized illumination

Abstract

Contains a transmission ptychography dataset collected from a chrome on glass Siemens star under optical illumination. The probe is generated by a randomized zone plate under illumination from a spatially filtered green laser. A single diffraction pattern was removed from the dataset and reported in a separate cxi file. In addition, a single exposure collected after manually defocusing the probe is reported. The ptychography dataset is used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.

Authors:
Publication Date:
Other Number(s):
CXIDB ID 175
DOE Contract Number:  
AC02-05CH11231
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Coherent X-ray Imaging Data Bank; Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Org.:
MIT
Keywords:
Thorlabs CPS532; XFEL; X-ray Free-electorn Lasers; Ptychography, Randomized Probe Imaging; Tabletop; Siemens Star
OSTI Identifier:
1722944
DOI:
https://doi.org/10.11577/1722944

Citation Formats

Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination. United States: N. p., 2020. Web. doi:10.11577/1722944.
Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination. United States. doi:https://doi.org/10.11577/1722944
Levitan, Abraham. 2020. "Single-frame far-field diffractive imaging with randomized illumination". United States. doi:https://doi.org/10.11577/1722944. https://www.osti.gov/servlets/purl/1722944. Pub date:Tue Nov 24 00:00:00 EST 2020
@article{osti_1722944,
title = {Single-frame far-field diffractive imaging with randomized illumination},
author = {Levitan, Abraham},
abstractNote = {Contains a transmission ptychography dataset collected from a chrome on glass Siemens star under optical illumination. The probe is generated by a randomized zone plate under illumination from a spatially filtered green laser. A single diffraction pattern was removed from the dataset and reported in a separate cxi file. In addition, a single exposure collected after manually defocusing the probe is reported. The ptychography dataset is used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.},
doi = {10.11577/1722944},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {11}
}

Works referenced in this record:

Single-frame far-field diffractive imaging with randomized illumination
journal, January 2020