Single-frame far-field diffractive imaging with randomized illumination
Abstract
Contains a transmission ptychography dataset collected from a chrome on glass Siemens star under optical illumination. The probe is generated by a randomized zone plate under illumination from a spatially filtered green laser. A single diffraction pattern was removed from the dataset and reported in a separate cxi file. In addition, a single exposure collected after manually defocusing the probe is reported. The ptychography dataset is used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.
- Authors:
- Publication Date:
- Other Number(s):
- CXIDB ID 175
- DOE Contract Number:
- AC02-05CH11231
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Coherent X-ray Imaging Data Bank; Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Sponsoring Org.:
- MIT
- Keywords:
- Thorlabs CPS532; XFEL; X-ray Free-electorn Lasers; Ptychography, Randomized Probe Imaging; Tabletop; Siemens Star
- OSTI Identifier:
- 1722944
- DOI:
- https://doi.org/10.11577/1722944
Citation Formats
Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination. United States: N. p., 2020.
Web. doi:10.11577/1722944.
Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination. United States. doi:https://doi.org/10.11577/1722944
Levitan, Abraham. 2020.
"Single-frame far-field diffractive imaging with randomized illumination". United States. doi:https://doi.org/10.11577/1722944. https://www.osti.gov/servlets/purl/1722944. Pub date:Tue Nov 24 00:00:00 EST 2020
@article{osti_1722944,
title = {Single-frame far-field diffractive imaging with randomized illumination},
author = {Levitan, Abraham},
abstractNote = {Contains a transmission ptychography dataset collected from a chrome on glass Siemens star under optical illumination. The probe is generated by a randomized zone plate under illumination from a spatially filtered green laser. A single diffraction pattern was removed from the dataset and reported in a separate cxi file. In addition, a single exposure collected after manually defocusing the probe is reported. The ptychography dataset is used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.},
doi = {10.11577/1722944},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {11}
}
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Works referenced in this record:
Single-frame far-field diffractive imaging with randomized illumination
journal, January 2020
- Levitan, Abraham L.; Keskinbora, Kahraman; Sanli, Umut T.
- Optics Express, Vol. 28, Issue 25