Quantification of thin film crystallographic orientation using X-ray diffraction with an area detector

Journal Article · Thu Feb 18 23:00:00 EST 2010 · Langmuir

DOI:https://doi.org/10.1021/la904840q· OSTI ID:986871

Baker, Jessica L; Jimison, Leslie H; Mannsfeld, Stefan; Volkman, Steven; Yin, Shong; Subramanian, Vivek; Salleo, Alberto; Alivisatos, A Paul; Toney, Michael F

As thin films become increasingly popular (for solar cells, LEDs, microelectronics, batteries), quantitative morphological information is needed to predict and optimize the film's electronic, optical and mechanical properties. This quantification can be obtained quickly and easily with X-ray diffraction using an area detector and synchrotron radiation in two simple geometries. In this paper, we describe a methodology for constructing complete pole figures for thin films with fiber texture (isotropic in-plane orientation). We demonstrate this technique on semicrystalline polymer films, self-assembled nanoparticle semiconductor films, and randomly-packed metallic nanoparticle films. This method can be immediately implemented to help understand the relationship between film processing and microstructure, enabling the development of better and less expensive electronic and optoelectronic devices.

• Research Organization: Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
• Sponsoring Organization: Materials Sciences Division
• DOE Contract Number: AC02-05CH11231
• OSTI ID: 986871
• Report Number(s): LBNL-3865E
• Journal Information: Langmuir, Journal Name: Langmuir; ISSN LANGD5; ISSN 0743-7463
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
47 OTHER INSTRUMENTATION
77 NANOSCIENCE AND NANOTECHNOLOGY
FIBERS
MECHANICAL PROPERTIES
MICROELECTRONICS
MICROSTRUCTURE
ORIENTATION
POLYMERS
PROCESSING
SOLAR CELLS
SYNCHROTRON RADIATION
TEXTURE
THIN FILMS
X-RAY DIFFRACTION
grazing-incidence X-ray diffraction
morphology
pole figure
texture analysis
thin film