Statistics of high purity nickel microstructure from high energy x-ray diffraction microscopy.

Journal Article · Thu Jan 01 04:00:00 EST 2009 · Comput. Mater. Con.

OSTI ID:984304

Hefferan, C M; Li, S F; Lind, J F; Lienert, U; Rollett, A D; Winblatt, P; Suter, R M

We have measured and reconstructed via forward modeling a small volume of microstructure of high purity, well annealed nickel using high energy xray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, and nearest neighbor grain misorientations are extracted. Results are consistent with recent electron backscatter diffraction measurements. Peaks in the grain neighbor misorientation angle distribution at 60 degrees (S3) and 39 degrees (S9) have resolution limited widths of {approx}0:14 degree FWHM. The analysis demonstrates that HEDM can recover grain and grain boundary statistics comparable to OIM volume measurements; more extensive data sets will lead to full, five parameter grain boundary character distributions. Due to its non-destructive nature, HEDM can then watch, both statistically and through tracking of individual grains and boundaries, the evolution of such distributions with processing of the sample.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC; NSF
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 984304
• Report Number(s): ANL/XSD/JA-67501
• Journal Information: Comput. Mater. Con., Journal Name: Comput. Mater. Con. Journal Issue: 3 ; 2009 Vol. 14; ISSN 1546-2218
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

36 MATERIALS SCIENCE
DIFFRACTION
DISTRIBUTION
ELECTRONS
GRAIN ORIENTATION
MICROSCOPY
MICROSTRUCTURE
NICKEL
PROCESSING
RESOLUTION
SIMULATION
STATISTICS
X-RAY DIFFRACTION