Characterization of microstructure and crack propagation in alumina using orientation imaging microscopy (OIM). December 1996

Technical Report · Sun Dec 01 04:00:00 EST 1996

DOI:https://doi.org/10.2172/443200· OSTI ID:443200

Glass, S J; Michael, J R ^[1]; Readey, M J ^[2]; Wright, S I; Field, D P ^[3]

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1. Sandia National Labs., Albuquerque, NM (United States)
2. Caterpillar, Inc., Peoria, IL (United States)
3. TSL, Inc., Provo, UT (United States)

A more complete description requires the lattice orientations of a statistically significant number of grains, coupled with morphology such as grain size and shape; this can be obtained using orientation imaging microscopy (OIM), which uses crystallographic orientation data from Backscattered Electron Kikuchi patterns (BEKP) collected using a SEM. This report describes the OIM results for alumina; these include image quality maps, grain boundary maps, pole figures, and lattice misorientations depicted on MacKenzie plot and in Rodrigues space. High quality BEKP were obtained and the images and data readily reveal the grain morphology, texture, and grain boundary misorientations, including those for cracked boundaries. A larger number of grains should be measured to make statistical comparisons between materials with different processing histories.

• Research Organization: Sandia National Labs., Albuquerque, NM (United States)
• Sponsoring Organization: USDOE Office of Energy Research, Washington, DC (United States)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 443200
• Report Number(s): SAND--96-1019; ON: DE97002705
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM OXIDES
CRACK PROPAGATION
MICROSTRUCTURE
TEXTURE