Characterization of microstructure and crack propagation in alumina using orientation imaging microscopy (OIM). December 1996
- Sandia National Labs., Albuquerque, NM (United States)
- Caterpillar, Inc., Peoria, IL (United States)
- TSL, Inc., Provo, UT (United States)
A more complete description requires the lattice orientations of a statistically significant number of grains, coupled with morphology such as grain size and shape; this can be obtained using orientation imaging microscopy (OIM), which uses crystallographic orientation data from Backscattered Electron Kikuchi patterns (BEKP) collected using a SEM. This report describes the OIM results for alumina; these include image quality maps, grain boundary maps, pole figures, and lattice misorientations depicted on MacKenzie plot and in Rodrigues space. High quality BEKP were obtained and the images and data readily reveal the grain morphology, texture, and grain boundary misorientations, including those for cracked boundaries. A larger number of grains should be measured to make statistical comparisons between materials with different processing histories.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 443200
- Report Number(s):
- SAND--96-1019; ON: DE97002705
- Country of Publication:
- United States
- Language:
- English
Similar Records
Statistics of high purity nickel microstructure from high energy x-ray diffraction microscopy.
Statistics of High Purity Nickel Microstructure From High Energy X-ray Diffraction Microscopy