Statistics of High Purity Nickel Microstructure From High Energy X-ray Diffraction Microscopy

Journal Article · Fri Sep 17 04:00:00 EDT 2010 · Comp. Mater. Cont.

OSTI ID:1006122

Hefferan, C M; Li, S F; Lind, J; Lienert, U; Rollett, A D; Wynblatt, P; Suter, R M

We have measured and reconstructed via forward modeling a small volume of microstructure of high purity, well annealed nickel using high energy x-ray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, and nearest neighbor grain misorientations are extracted. Results are consistent with recent electron backscatter diffraction measurements. Peaks in the grain neighbor misorientation angle distribution at 60 degrees ({Sigma}3) and 39 degrees ({Sigma}9) have resolution limited widths of {approx} 0.14 degree FWHM. The analysis demonstrates that HEDM can recover grain and grain boundary statistics comparable to OIM volume measurements; more extensive data sets will lead to full, five parameter grain boundary character distributions. Due to its non-destructive nature, HEDM can then watch, both statistically and through tracking of individual grains and boundaries, the evolution of such distributions with processing of the sample.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: USDOE
• OSTI ID: 1006122
• Journal Information: Comp. Mater. Cont., Journal Name: Comp. Mater. Cont. Journal Issue: (3) ; 2009 Vol. 14; ISSN 1546-2218
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

43 PARTICLE ACCELERATORS
DIFFRACTION
DISTRIBUTION
ELECTRONS
GRAIN ORIENTATION
MICROSCOPY
MICROSTRUCTURE
NICKEL
ORIENTATION
PROCESSING
RESOLUTION
SIMULATION
STATISTICS
SYNCHROTRON RADIATION
X-RAY DIFFRACTION