Large area detector based computed tomography system for production nondestructive evaluation.

Conference · Mon Jan 01 04:00:00 EST 2001

OSTI ID:975274

Keating, S C ^[1]; Davis, A A ^[2]; Claytor, T N ^[3]

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1. Scott C.
2. Anthony A.
3. Thomas N.

We present a system for industrial x-ray computed tomography that has been optimized for all phases of nondestructive component inspection. Data acquisition is greatly enhanced by the use of high resolution, large area, flat-panel amorphous-silicon detectors. The detectors have proven, over several years, to be a robust alternative to CCD-optics and image intensifier CT systems. In addition to robustness, these detectors provide the advantage of area detection as compared with the single slice geometry of linear array systems. Parallel processing provides significant speed improvements for data reconstruction, and is implemented for parallel-beam, fan-beam and Feldkamp conebeam reconstruction algorithms. By clustering ten or more equal-speed computers, reconstruction times are reduced by an order of magnitude. We have also developed interactive software for visualization and interrogation of the full three-dimensional dataset. Inspection examples presented in this paper include an electro-mechanical device, nonliving biological specimens and a turbo-machinery component. We also present examples of everyday items for the benefit of the layperson.

• Research Organization: Los Alamos National Laboratory
• Sponsoring Organization: DOE
• OSTI ID: 975274
• Report Number(s): LA-UR-01-1668
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS
ALGORITHMS
COMPUTERIZED TOMOGRAPHY
COMPUTERS
CONES
DATA ACQUISITION
DETECTION
EVALUATION
GEOMETRY
IMAGE INTENSIFIERS
PARALLEL PROCESSING
PRODUCTION
RESOLUTION
TOMOGRAPHY
VELOCITY