Large area detector based computed tomography system for production nondestructive evaluation.
- Scott C.
- Anthony A.
- Thomas N.
We present a system for industrial x-ray computed tomography that has been optimized for all phases of nondestructive component inspection. Data acquisition is greatly enhanced by the use of high resolution, large area, flat-panel amorphous-silicon detectors. The detectors have proven, over several years, to be a robust alternative to CCD-optics and image intensifier CT systems. In addition to robustness, these detectors provide the advantage of area detection as compared with the single slice geometry of linear array systems. Parallel processing provides significant speed improvements for data reconstruction, and is implemented for parallel-beam, fan-beam and Feldkamp conebeam reconstruction algorithms. By clustering ten or more equal-speed computers, reconstruction times are reduced by an order of magnitude. We have also developed interactive software for visualization and interrogation of the full three-dimensional dataset. Inspection examples presented in this paper include an electro-mechanical device, nonliving biological specimens and a turbo-machinery component. We also present examples of everyday items for the benefit of the layperson.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 975274
- Report Number(s):
- LA-UR-01-1668; TRN: US201008%%149
- Resource Relation:
- Conference: "Submitted to: ASNT Spring Conference and 10th Annual Research Symposium, Denver Co. USA, March 26-30 2001"
- Country of Publication:
- United States
- Language:
- English
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