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Further advancements for large area-detector based computed tomography system

Conference ·
OSTI ID:975270
We present advancements made to a large area-detector based system for industrial x-ray computed tomography. Past performance improvements in data acquisition speeds were made by use of high-resolution large area, flat-panel amorphous-silicon (a-Si) detectors. The detectors have proven, over several years, to be a robust alternative to CCD-optics and image intensifier CT systems. These detectors also provide the advantage of area detection as compared with the single slice geometry of linear array systems. New advancements in this system include parallel processing of sinogram reconstructions, improved visualization software and migration to frame-rate a-Si detectors. Parallel processing provides significant speed improvements for data reconstruction, and is implemented for parallel-beam, fan-beam and Feldkamp cone-beam reconstruction algorithms. Reconstruction times are reduced by an order of magnitude by use of a cluster of ten or more equal-speed computers. Advancements in data visualization are made through interactive software, which allows interrogation of the full three-dimensional dataset. Inspection examples presented in this paper include an electromechanical device, a nonliving biological specimen and a press-cast plastic specimen. We also present a commonplace item for the benefit of the layperson.
Research Organization:
Los Alamos National Laboratory
Sponsoring Organization:
DOE
OSTI ID:
975270
Report Number(s):
LA-UR-01-1445
Country of Publication:
United States
Language:
English