Skip to main content
OSTI.GOVU.S. Department of Energy Office of Scientific and Technical Information
U.S. Department of Energy
Office of Scientific and Technical Information
 

A test methodology for determining space-readiness of Xilinx SRAM-based FPGA devices and designs

Journal Article · · IEEE Transactions on Instrumentation and Measurement
OSTI ID:960996
 [1];  [1];  [1];  [1];  [1];  [2];  [2]
  1. Los Alamos National Laboratory
  2. BYU
+ Show Author Affiliations
No abstract prepared.
Research Organization:
Los Alamos National Laboratory (LANL)
Sponsoring Organization:
DOE
DOE Contract Number:
AC52-06NA25396
OSTI ID:
960996
Report Number(s):
LA-UR-08-06940; LA-UR-08-6940
Journal Information:
IEEE Transactions on Instrumentation and Measurement, Journal Name: IEEE Transactions on Instrumentation and Measurement; ISSN IEIMAO; ISSN 0018-9456
Country of Publication:
United States
Language:
English

Similar Records

A Test Methodology for Determining Space-Readiness of Xilinx SRAM-Based FPGA Designs
Conference · Mon Dec 31 23:00:00 EST 2007 · OSTI ID:957712
Validation techniques for fault emulation of SRAM-based FPGAs
Journal Article · Fri Aug 07 00:00:00 EDT 2015 · IEEE Transactions on Nuclear Science · OSTI ID:1312566
Reliability concerns with logical constants in Xilinx FPGA designs
Conference · Wed Dec 31 23:00:00 EST 2008 · OSTI ID:990795

Related Subjects

42 ENGINEERING
EQUIPMENT
LOGIC CIRCUITS
PERFORMANCE
PHYSICAL RADIATION EFFECTS
SIMULATION
TESTING