In Situ Synchrotron X-Ray Diffraction Experiments on Electrochemically Deposited ZnO Nanostructures
Journal Article
·
· J. Phys. Chem. C112:14863,2008
OSTI ID:953124
We present results of in situ synchrotron X-ray diffraction experiments on electrochemically formed ZnO nanostructured films during their growth on to Au substrates. This allows the evolution of texture to be monitored throughout the deposition process. The results are in good agreement with previous in situ X-ray absorption spectroscopy measurements of growth kinetics and indicate that strong preferred orientation, which is not evident from the microstructure, develops early in the growth process.
- Research Organization:
- Stanford Linear Accelerator Center (SLAC)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-76SF00515
- OSTI ID:
- 953124
- Report Number(s):
- SLAC-REPRINT-2009-160
- Journal Information:
- J. Phys. Chem. C112:14863,2008, Journal Name: J. Phys. Chem. C112:14863,2008 Journal Issue: 38 Vol. 112; ISSN 1932-7447
- Country of Publication:
- United States
- Language:
- English
Similar Records
In Situ Synchrotron Studies of ZnO Nanostructures During Electrochemical Deposition
In Situ Synchrotron Studies of ZnO Nanostructures During Electrochemical Deposition
Direct Observation of Distinct Nucleation And Growth Processes in Electrochemically Deposited ZnO Nanostructures Using in Situ XANES
Journal Article
·
Mon May 11 00:00:00 EDT 2009
· Curr.Appl.Phys.8:455-458,2008
·
OSTI ID:958642
In Situ Synchrotron Studies of ZnO Nanostructures During Electrochemical Deposition
Journal Article
·
Mon Dec 31 23:00:00 EST 2007
· Current Applied Physics
·
OSTI ID:960164
Direct Observation of Distinct Nucleation And Growth Processes in Electrochemically Deposited ZnO Nanostructures Using in Situ XANES
Journal Article
·
Thu Apr 30 00:00:00 EDT 2009
· J.Phys.Chem.C112:2820-2824,2008
·
OSTI ID:958646