Rapid autotuning for crystalline specimens from an inline hologram
Journal Article
·
· Journal of Electron Microscopy
- ORNL
We derive a simple to implement method to approximately measure the aberration function for a crystalline specimen from an inline hologram. We demonstrate measurement of aberrations up to third order for a scanning transmission electron microscope from both dynamical simulations and experimental Ronchigrams. This method should allow rapid fine-tuning on a variety of crystalline specimens and represents a key step towards adaptive optics for electron microscopy.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- ORNL work for others; SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 947577
- Journal Information:
- Journal of Electron Microscopy, Journal Name: Journal of Electron Microscopy Journal Issue: 6 Vol. 57
- Country of Publication:
- United States
- Language:
- English
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