Electron microscopy studies and image simulation of the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/BaF{sub 2} interface
Book
·
OSTI ID:94063
- Cornell Univ., Ithaca, NY (United States)
Images of the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/BaF{sub 2} interface obtained with a scanning transmission electron microscope (STEM) show a relatively wide ({approximately}40 {angstrom}) band of contrast at the interface, despite attempts to orient the interface plane parallel to the beam. Simulation of STEM annular dark field (ADF) images of several different interface geometries suggests that strain is the dominant cause of this wide band of contrast at the interface. In particular, it is the dislocations which run normal to the beam direction which make a significant contribution to the width of the contrast band in the case of this YBCO/BaF{sub 2} interface. A line scan taken across the interface using energy dispersive X-ray spectrometry (EDX) suggests that there is no significant Ba concentration at the interface, indicating the Z-contrast is not the primary contrast mechanism in these ADF images of the YBCO/BaF{sub 2} interface.
- OSTI ID:
- 94063
- Report Number(s):
- CONF-941144--; ISBN 1-55899-258-8
- Country of Publication:
- United States
- Language:
- English
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