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Title: Annular dark field electron microscope images with better than 2 A resolution at 100 kV

Journal Article · · Applied Physics Letters; (USA)
DOI:https://doi.org/10.1063/1.102297· OSTI ID:5043059
; ;  [1]
  1. School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (US)

High-resolution scanning transmission electron microscope (STEM) images in the annular dark field (ADF) imaging mode approaching the theoretical point-to-point resolution limit are presented. The ADF images were obtained from a high {ital T}{sub {ital c}} superconducting YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} thin-film specimen at 100 kV. The 1.9 A resolution lattice image, which is the smallest lattice spacing in the specimen, corresponds to the minimum resolvable spatial frequency with 5% contrast in the contrast transfer function for annular dark field, and is smaller than the resolution limit given by the Rayleigh criterion. This demonstrates that STEM ADF imaging can have a resolution approximately 40% better than that of the bright field conventional transmission electron microscope (CTEM) imaging at Scherzer condition.

OSTI ID:
5043059
Journal Information:
Applied Physics Letters; (USA), Vol. 55:23; ISSN 0003-6951
Country of Publication:
United States
Language:
English