Annular dark field electron microscope images with better than 2 A resolution at 100 kV
- School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (US)
High-resolution scanning transmission electron microscope (STEM) images in the annular dark field (ADF) imaging mode approaching the theoretical point-to-point resolution limit are presented. The ADF images were obtained from a high {ital T}{sub {ital c}} superconducting YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} thin-film specimen at 100 kV. The 1.9 A resolution lattice image, which is the smallest lattice spacing in the specimen, corresponds to the minimum resolvable spatial frequency with 5% contrast in the contrast transfer function for annular dark field, and is smaller than the resolution limit given by the Rayleigh criterion. This demonstrates that STEM ADF imaging can have a resolution approximately 40% better than that of the bright field conventional transmission electron microscope (CTEM) imaging at Scherzer condition.
- OSTI ID:
- 5043059
- Journal Information:
- Applied Physics Letters; (USA), Vol. 55:23; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
BARIUM OXIDES
ELECTRON MICROSCOPY
LATTICE PARAMETERS
COPPER OXIDES
RESOLUTION
YTTRIUM OXIDES
CRYSTAL STRUCTURE
EXPERIMENTAL DATA
IMAGES
SCANNING ELECTRON MICROSCOPY
SUPERCONDUCTING FILMS
SURFACES
TRANSMISSION ELECTRON MICROSCOPY
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
CHALCOGENIDES
COPPER COMPOUNDS
DATA
FILMS
INFORMATION
MICROSCOPY
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
360202* - Ceramics
Cermets
& Refractories- Structure & Phase Studies
656100 - Condensed Matter Physics- Superconductivity
400101 - Activation
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Radiometric & Radiochemical Procedures