Characterization of electrochemically prepared {gamma}-NiOOH by XPS.

Journal Article · Mon Jan 01 04:00:00 EST 1996 · Surf. Sci. Spectra

OSTI ID:937993

Mansour, A N; Melendres, C A

We report x-ray photoemission spectra (XPS) of electrochemically prepared gamma-NiOOH. XPS spectra were measured with the Physical Electronics Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg K alpha x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0-1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, K, and Ni photoemission lines, valence band region, as well as Ni LMM Auger line were measured at an analyzer energy resolution of 0.54 eV. The gamma-NiOOH sample was prepared by the anodic oxidation of anodically formed alpha-Ni(OH)2.

• Research Organization: Argonne National Laboratory (ANL)
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 937993
• Report Number(s): ANL/CMT/JA-25406
• Journal Information: Surf. Sci. Spectra, Journal Name: Surf. Sci. Spectra Journal Issue: 3 ; 1996 Vol. 3; ISSN SSREDI; ISSN 0167-5729
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
ELECTROCHEMICAL CELLS
ENERGY RANGE
ENERGY RESOLUTION
NICKEL HYDROXIDES
SAMPLE PREPARATION
X-RAY PHOTOELECTRON SPECTROSCOPY