Characterization of slightly hydrated Ni(OH){sub 2} by XPS

Journal Article · Tue Dec 31 04:00:00 EST 1996 · Surface Science Spectra

OSTI ID:569273

Mansour, A N ^[1]; Melendres, C A ^[2]

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1. Naval Surface Warfare Center, Silver Spring, MD (United States). Carderock Div.
2. Argonne National Lab., IL (United States)

The authors report x-ray photoemission spectra (XPS) of slightly hydrated Ni(OH){sub 2}. XPS spectra were measured with the Physical Electronics Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg K{sub {alpha}} x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. The authors present the survey spectrum (binding energy range of 0--1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, and Ni photoemission lines, valence band region, as well as Ni LVV Auger lines were measured at an analyzer energy resolution of 0.54 eV. The slightly hydrated Ni(OH){sub 2} sample was prepared by reacting stoichiometric Ni(NO{sub 3}){sub 2} with KOH in CO{sub 2} free H{sub 2}O at 35 C.

• Sponsoring Organization: USDOE, Washington, DC (United States)
• OSTI ID: 569273
• Journal Information: Surface Science Spectra, Journal Name: Surface Science Spectra Journal Issue: 3 Vol. 3; ISSN 1055-5269; ISSN SSSPEN
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
BINDING ENERGY
CHEMICAL PREPARATION
EXPERIMENTAL DATA
HYDRATES
NICKEL HYDROXIDES
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
X-RAY SPECTRA