Characterization of Ni{sub 2}O{sub 3} {center_dot} 6H{sub 2}O by XPS

Journal Article · Tue Dec 31 04:00:00 EST 1996 · Surface Science Spectra

OSTI ID:569278

Mansour, A N ^[1]; Melendres, C A ^[2]

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1. Naval Surface Warfare Center, Silver Spring, MD (United States). Carderock Div.
2. Argonne National Lab., IL (United States)

The authors report photoemission spectra (XPS) of hydrated nickelic oxide (Ni{sub 2}O{sub 3} {center_dot} 6H{sub 2}O). XPS spectra were measured with the Physical Electronics Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg K{sub {alpha}} x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. The authors present the survey spectrum (binding energy range of 0--1,100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, and Ni photoemission lines, valence band region, as well as the Ni LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The Ni{sub 2}O{sub 3} {center_dot} 6H{sub 2}O sample was obtained commercially from Alfa. XPS results show that the near surface region consists of a large proportion of Ni(OH){sub 2}. In addition, the sample contains Na and Cl in small quantities. The presence of Na and Cl is probably an artifact of sample preparation procedures.

• Sponsoring Organization: USDOE, Washington, DC (United States)
• OSTI ID: 569278
• Journal Information: Surface Science Spectra, Journal Name: Surface Science Spectra Journal Issue: 3 Vol. 3; ISSN 1055-5269; ISSN SSSPEN
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
BINDING ENERGY
CHLORINE
EXPERIMENTAL DATA
HYDRATES
NICKEL HYDROXIDES
NICKEL OXIDES
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
SODIUM
X-RAY SPECTRA