A High Resolution X-ray fluorescence spectrometer for near edge absorption studies
Journal Article
·
· Review of Scientific Instruments
A high-resolution fluorescence spectrometer using a Johann geometry in a backscattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high-resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near-edge absorption spectrum of dysprosium nitrate.
- Research Organization:
- Brookhaven National Laboratory (BNL) National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 930063
- Report Number(s):
- BNL--80690-2008-JA
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Vol. 63; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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