A high-resolution x-ray fluorescence spectrometer for near-edge absorption studies

Journal Article · Wed Jan 01 04:00:00 EST 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1143112· OSTI ID:5645661

Stojanoff, V; Haemaelaeinen, K; Siddons, D P; Hastings, J B; Berman, L E; Cramer, S; Smith, G ^[1]

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1. NSLS, Brookhaven National Laboratory, Upton, New York 11973 (United States)

A high-resolution fluorescence spectrometer using a Johann geometry in a backscattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high-resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near-edge absorption spectrum of dysprosium nitrate.

• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5645661
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 63:1; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BACKSCATTERING
CHEMICAL ANALYSIS
DESIGN
DYSPROSIUM COMPOUNDS
DYSPROSIUM NITRATES
ENERGY RANGE
KEV RANGE
KEV RANGE 01-10
MEASURING INSTRUMENTS
NITRATES
NITROGEN COMPOUNDS
NONDESTRUCTIVE ANALYSIS
OXYGEN COMPOUNDS
RARE EARTH COMPOUNDS
RESOLUTION
SCATTERING
SPECTROMETERS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYZERS
X-RAY SPECTROMETERS