A high resolution x-ray fluorescence spectrometer for near edge absorption studies

Conference · Tue Jan 01 04:00:00 EST 1991

OSTI ID:5930450

Stojanoff, V; Hamalainen, K; Siddons, D P; Hastings, J B; Berman, L E; Cramer, S; Smith, G

A high resolution fluorescence spectrometer using a Johann geometry in a back scattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near edge absorption spectrum of dysprosium nitrate. 10 refs., 4 figs.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: DOE; USDOE, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5930450
• Report Number(s): BNL-46809; CONF-910730--28; ON: DE92004991
• Country of Publication: United States
• Language: English

Related Subjects

440600 -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
664200* -- Spectra of Atoms & Molecules & their Interactions with Photons-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
BACKSCATTERING
CHEMICAL ANALYSIS
DYSPROSIUM COMPOUNDS
DYSPROSIUM NITRATES
EMISSION SPECTROSCOPY
ENERGY RESOLUTION
FLUORESCENCE SPECTROSCOPY
MEASURING INSTRUMENTS
NITRATES
NITROGEN COMPOUNDS
NONDESTRUCTIVE ANALYSIS
OXYGEN COMPOUNDS
RARE EARTH COMPOUNDS
RESOLUTION
SCATTERING
SPECTRA
SPECTROMETERS
SPECTROSCOPY
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTRA
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY