Characterization of yttria-stabilized zirconia coatings with controlled nanometer-sized porosity by SANS.
Coatings of cubic yttria-stabilized zirconia (YSZ) grown on alumina (Al{sub 2}O{sub 3}) substrates were characterized with regard to structure, grain morphology and porosity. The present study shows that the deposition of YSZ films onto polycrystalline Al{sub 2}O{sub 3} substrates by MOCVD (metal organic chemical vapor deposition) under the given deposition conditions leads to nanostructured film morphologies with mean grain sizes in the range 10-14 nm when the substrate temperature is 450-550 C. Small angle neutron scattering (SANS) was applied to analyze the pore structure in the nanometer range, revealing that the films have a pronounced, very finely dispersed porosity. For substrate temperatures ranging from 425-500 C the average pore diameters are between 0.7 and 1 nm. For higher substrate temperatures, the pore size increases, reaching an average diameter of 5.4 nm at a substrate temperature of 600 C.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 925011
- Report Number(s):
- ANL/MSD/CP-105493; TRN: US200807%%142
- Journal Information:
- Appl. Phys. A, Vol. 74, Issue Suppl. S ; Dec. 2002; Conference: International Conference on Neutron Scattering 2001; Sep 9-13, 2001; Munich, Germany
- Country of Publication:
- United States
- Language:
- ENGLISH
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