Synchrotron-based Imaging and tomography with hard X-rays.
Hard X-ray imaging with synchrotron radiation is a powerful tool to study opaque materials on the micro- and nano-lengthscales. Different imaging methods are available with an instrument recently built at Sector 34 of the Advanced Photon Source. In-line phase contrast imaging is performed with micrometer resolution. Increased spatial resolution is achieved using cone-beam geometry. The almost parallel beam is focused with a Kirkpatrick-Baez mirror system. The focal spot serves as a diverging secondary source. An X-ray magnified image of the sample is projected on the detector. For imaging and tomography with sub-100 nm resolution, an X-ray full-field microscope has been built. It uses a Kirkpatrick-Baez mirror (KB) as a condenser optic, followed by a micro-Fresnel zone plate (FZP) as an objective lens. The zone plates presently provide 50-85 nm spatial resolution when operating the microscope with photon energy between 6 and 12 keV. Tomography experiments have been performed with this new device.
- Research Organization:
- Argonne National Laboratory (ANL)
- Sponsoring Organization:
- SC; NSF; NIST
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 917243
- Report Number(s):
- ANL/XSD/JA-60069
- Journal Information:
- Nucl. Instrum. Methods Phys. Res. B, Journal Name: Nucl. Instrum. Methods Phys. Res. B Journal Issue: Mar. 28, 2007 Vol. 261; ISSN 0168-583X; ISSN NIMBEU
- Country of Publication:
- United States
- Language:
- ENGLISH
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