Dynamics of polymer bilayer films.

Journal Article · Tue Nov 14 23:00:00 EST 2006 · J. Non-Cryst. Solids

DOI:https://doi.org/10.1016/j.jnoncrysol.2006.02.180· OSTI ID:915328

Hu, X; Narayanan, S; Lurio, L B; Lal, J

We report grazing incidence coherent X-ray measurements from polymer bilayers consisting of spun-cast layers of Polystyrene (PS) and Poly(4-bromo styrene) (PBrS) supported on silicon wafers. For PS/PBrS/Si bilayers, the films are stable and we are able to probe equilibrium thermal surface height fluctuations using X-ray Photon Correlation Spectroscopy (XPCS). When the layers are inverted to PBrS/PS/Si, the films de-wet. In this geometry we can measure both the non-equilibrium evolution of the film structure using time-resolved surface diffuse X-ray scattering and quasi-equilibrium fluctuations of the de-wetting film using XPCS.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC; NSF
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 915328
• Report Number(s): ANL/IPNS/JA-57246
• Journal Information: J. Non-Cryst. Solids, Journal Name: J. Non-Cryst. Solids Journal Issue: 42-49 ; Nov. 15, 2006 Vol. 352; ISSN JNCSBJ; ISSN 0022-3093
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
FLUCTUATIONS
GEOMETRY
PHOTONS
POLYMERS
POLYSTYRENE
PROBES
SCATTERING
SILICON
SPECTROSCOPY
STYRENE