Surface Dynamics of Block Copolymer Films by X-ray Photon Correlation Spectroscopy

Journal Article · Sun Apr 19 04:00:00 EDT 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3137883· OSTI ID:21301142

Song, Sanghoon; Cha, Wonsuk; Lee, Heeju; Li, Xiaolong; Kim, Hyunjung ^[1]; Jiang, Zhang ^[2]; Narayanan, Suresh ^[2]; Ruehm, Adrian ^[3]; Sinha, S K ^[4]

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1. Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, Seoul (Korea, Republic of)
2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois (United States)
3. Max Planck Institute for Metal Research, Stuttgart (Germany)
4. Department of Physics, University of California San Diego, La Jolla, California (United States)

We investigated the structure and dynamics of supported block copolymer films of poly(styrene)-b-poly(dimethylsiloxane)(PS-b-PDMS) in the spherical phase by x-ray photon correlation spectroscopy (XPCS) in grazing angle geometry. The temperature range studied was between 160 deg. and 210 deg. C, much higher than glass transition temperature (Tg), with thickness from 40 nm to 600 nm. Using x-ray reflectivity and x-ray photoelectron spectroscopy (XPS), we found that the PDMS-rich layer near the surface appeared at a temperature higher than Tg. Universal scaling of the dynamics, even with the bilayer model, was observed. From the fitting with the bilayer model, viscosities from both layers were obtained. The results from the surface dynamics are compared with the theory of overdamped thermal capillary waves on thin films.

• OSTI ID: 21301142
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1119; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CAPILLARIES
COPOLYMERS
CORRELATIONS
LAYERS
POLYSTYRENE
REFLECTIVITY
SURFACES
TEMPERATURE DEPENDENCE
THIN FILMS
TRANSITION TEMPERATURE
VISCOSITY
X-RAY PHOTOELECTRON SPECTROSCOPY