Dissolution characteristics of Al2Cu and Al-4%Cu thin films.
Journal Article
·
· Proposed for publication in Electrochemical Society Transactions.
OSTI ID:909914
- Industrial Research Limited, Wellington, New Zealand
- Brookhaven National Laboratories, Upton, NY
- Xiamen University, Xiamen, China
No abstract prepared.
- Research Organization:
- Sandia National Laboratories
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 909914
- Report Number(s):
- SAND2006-7913J
- Journal Information:
- Proposed for publication in Electrochemical Society Transactions., Journal Name: Proposed for publication in Electrochemical Society Transactions.
- Country of Publication:
- United States
- Language:
- English
Similar Records
TEXTURE AND RESISTIVITY OF DILUTE BINARY CU(AL), CU(IN), CU(TI), CU(NB), CU(IR), AND CU(W) ALLOY THIN FILMS
Local microstructure and stress in Al(Cu) thin film structures studied by x-ray microdiffraction
Structure of Pseudomorphic and reconstructed thin Cu films on Ru
Journal Article
·
Mon Dec 31 23:00:00 EST 2001
· Journal of Vacuum Science and Technology, A
·
OSTI ID:15008564
Local microstructure and stress in Al(Cu) thin film structures studied by x-ray microdiffraction
Journal Article
·
Sat Mar 31 23:00:00 EST 2001
· Materials Research Society Symposium Proceedings
·
OSTI ID:800530
Structure of Pseudomorphic and reconstructed thin Cu films on Ru
Journal Article
·
Fri Dec 31 23:00:00 EST 1999
· Phys. Rev. B
·
OSTI ID:796489