A New Approach for Electron Tomography: Annular Dark-FieldTransmission Electron Microscopy
We have demonstrated the applicability of ADF-TEM for tomography. When comparing this technique with BF-TEM tomography it is obvious that both technique scan be complementary: BF-TEM tomography yields information about the morphology, whereas ADF-TEM tomography provides chemical information in the TEM mode, similar to HAADF-STEM tomography, although HAADFSTEM images yield a higher contrast difference for different Z values. Indeed, when ADF-TEM tomography is compared to HAADF-STEM tomography, it is clear that both techniques yield comparable results. It has been noted that the individual projections using ADF-TEM are acquired in TEM mode with exposure times of typically one to three seconds, without the presence of scanning noise. This makes the technique extremely useful in cases where a reduction of the acquisition time is desired; thus reducing beam damage also. Although ADF-TEM was originally developed to avoid the presence of Bragg scattering, the high image contrast obtained suggests that ADF-TEM tomography is not only interesting for materials science but also for biological applications.
- Research Organization:
- Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
- Sponsoring Organization:
- USDOE Director. Office of Science. Office of AdvancedScientific Computing Research. Office of Basic EnergySciences
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 899746
- Report Number(s):
- LBNL--61672; BnR: KC0201010
- Journal Information:
- Advanced Materials, Journal Name: Advanced Materials Vol. 18
- Country of Publication:
- United States
- Language:
- English
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