SYNCHROTRON X-RAY BASED CHARACTERIZATION OF CDZNTE CRYSTALS

Journal Article · Thu Sep 28 04:00:00 EDT 2006 · Journal of Electronic Materials

OSTI ID:894729

Duff, M

Synthetic CdZnTe or 'CZT' crystals can be used for the room temperature-based detection of {gamma}-radiation. Structural/morphological heterogeneities within CZT, such as twinning, inclusions, and polycrystallinity can affect detector performance. We used a synchrotron-based X-ray technique, specifically extended X-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission IR imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.

• Research Organization: SRS
• Sponsoring Organization: DOE
• DOE Contract Number: AC09-96SR18500
• OSTI ID: 894729
• Report Number(s): WSRC-MS-2006-00395
• Journal Information: Journal of Electronic Materials, Journal Name: Journal of Electronic Materials; ISSN JECMA5; ISSN 0361-5235
• Publisher: pubinfo
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION
DETECTION
FINE STRUCTURE
PERFORMANCE
RADIATION DETECTORS
SPECTROSCOPY
SYNCHROTRONS
TWINNING