CHARACTERIZATION OF DETECTOR GRADE CDZNTE MATERIAL FROM REDLEN TECHNOLOGIES

Journal Article · Wed Jul 09 04:00:00 EDT 2008 · SPIE Proceedings

DOI:https://doi.org/10.1117/12.798921· OSTI ID:935221

Duff, M

CdZnTe (or CZT) crystals can be used in a variety of detector-type applications. This large band gap material shows great promise for use as a gamma radiation spectrometer. Historically, the performance of CZT has typically been adversely affected by point defects, structural and compositional heterogeneities within the crystals, such as twinning, pipes, grain boundaries (polycrystallinity) and secondary phases (SP). The synthesis of CZT material has improved greatly with the primary performance limitation being attributed to mainly SP. In this presentation, we describe the extensive characterization of detector grade material that has been treated with post growth annealing to remove the SPs. Some of the analytical methods used in this study included polarized, cross polarized and transmission IR imaging, I-V curves measurements, synchrotron X-ray topography and electron microscopy.

• Research Organization: SRS
• Sponsoring Organization: DOE
• DOE Contract Number: AC09-96SR18500
• OSTI ID: 935221
• Report Number(s): WSRC-STI-2008-0351
• Journal Information: SPIE Proceedings, Journal Name: SPIE Proceedings
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ANNEALING
ELECTRON MICROSCOPY
GAMMA RADIATION
GRAIN BOUNDARIES
PERFORMANCE
POINT DEFECTS
SYNCHROTRONS
SYNTHESIS
TOPOGRAPHY
TWINNING