X-ray Topography to Characterize Surface Damage on CdZnTe Crystals

Conference · Fri Dec 05 04:00:00 EST 2008

OSTI ID:1009051

Black, David; Woicik, Joseph; Duff, Martine C; Hunter, Douglas B; Burger, Arnold; Groza, Michael ^[1]

---

1. SRNL

Synthetic CdZnTe or 'CZT' crystals can be used for room temperature detection of {gamma}-radiation. Structural/morphological heterogeneities within CZT, such as twinning, secondary phases (often referred to as inclusions or precipitates), and poly-crystallinity can affect detector performance. As part of a broader study using synchrotron radiation techniques to correlate detector performance to microstructure, x-ray topography (XRT) has been used to characterize CZT crystals. We have found that CZT crystals almost always have a variety of residual surface damage, which interferes with our ability to observe the underlying microstructure for purposes of crystal quality evaluation. Specific structures are identifiable as resulting from fabrication processes and from handling and shipping of sample crystals. Etching was found to remove this damage; however, our studies have shown that the radiation detector performance of the etched surfaces was inferior to the as-polished surface due to higher surface currents which result in more peak tailing and less energy resolution. We have not fully investigated the effects of the various types of inducible damage on radiation detector performance.

• Research Organization: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
• Sponsoring Organization: USDOE
• OSTI ID: 1009051
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

43 PARTICLE ACCELERATORS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DETECTION
ENERGY RESOLUTION
ETCHING
EVALUATION
FABRICATION
MICROSTRUCTURE
PERFORMANCE
RADIATION DETECTION
RADIATION DETECTORS
SYNCHROTRON RADIATION
TAILINGS
TOPOGRAPHY
TWINNING