Formation of ZnTe:Cu/Ti Contacts at High Temperature for CdS/CdTe Devices (Presentation)
Conference
·
OSTI ID:894427
The conclusions of this report are that Cu diffusion from a ZnTe:Cu contact causes good and bad things. The good (Cu in CdS < low 10{sup 18} cm{sup -3})--increase in CdTe N{sub A}-N{sub D} that leads to V{sub oc} and FF improvement. The bad (Cu in CdS > low 10{sup 18} cm{sup -3})--(1) possibly decreased of shunt resistance (?); (2) depletion width in CdTe can become too narrow for optimum current collection at J{sub MPP}; (3) donor reduction in CdS (significant FF loss in LIV); and (4) excessive Cu diffusion into CdS readily observed by red-light bias QE.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO.
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC36-99GO10337
- OSTI ID:
- 894427
- Report Number(s):
- NREL/PR-520-39845
- Country of Publication:
- United States
- Language:
- English
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