Synchrotron radiation, soft-X-ray spectroscopy andnanomaterials

Journal Article · Mon Sep 13 00:00:00 EDT 2004 · International Journal of Nanotechnology

DOI:https://doi.org/10.1504/IJNT.2004.003729· OSTI ID:882250

Guo, Jinghua

Both synchrotron radiation based soft-X-ray absorption spectroscopy (XAS) and resonant soft-X-ray emission spectroscopy (XES) on a variety of nano-structured systems has yielded characteristic fingerprints. With high-resolution monochromatized synchrotron radiation excitation, resonant inelastic X-ray scattering (RIXS) has emerged as a new source of information about electronic structure and excitation dynamics of nanomaterials. The selectivity of the excitation, in terms of energy and polarization, has also facilitated studies of emission anisotropy. Various features observed in resonant emission spectra have been identified and studied.

• Research Organization: Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
• Sponsoring Organization: USDOE Director. Office of Science. Office of Basic EnergySciences
• DOE Contract Number: AC02-05CH11231
• OSTI ID: 882250
• Report Number(s): LBNL--54719; BnR: KC0204016
• Journal Information: International Journal of Nanotechnology, Journal Name: International Journal of Nanotechnology Journal Issue: 1/2 Vol. 1
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
43 PARTICLE ACCELERATORS
ABSORPTION SPECTROSCOPY
ANISOTROPY
ELECTRONIC STRUCTURE
EMISSION SPECTRA
EMISSION SPECTROSCOPY
EXCITATION
POLARIZATION
SCATTERING
SPECTROSCOPY
SYNCHROTRON RADIATION
X-ray spectroscopy nanostructured materials