New reflections on hard X-ray photon-in/photon-out spectroscopy

Lafuerza, Sara; Retegan, Marius; Detlefs, Blanka; Chatterjee, Ruchira; Yachandra, Vittal; Yano, Junko; Glatzel, Pieter

doi:10.1039/d0nr01983f

Title: New reflections on hard X-ray photon-in/photon-out spectroscopy

Journal Article · Fri Jul 17 00:00:00 EDT 2020 · Nanoscale

DOI:https://doi.org/10.1039/d0nr01983f· OSTI ID:1782156

^[1];

^[1]; Chatterjee, Ruchira ^[2]; Yachandra, Vittal ^[2]; Yano, Junko ^[2];

^[1]

European Synchrotron Radiation Facility (ESRF), Grenoble (France)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Analysis of the electronic structure and local coordination of an element is an important aspect in the study of the chemical and physical properties of materials. This is particularly relevant at the nanoscale where new phases of matter may emerge below a critical size. X-ray emission spectroscopy (XES) at synchrotron radiation sources and free electron lasers has enriched the field of X-ray spectroscopy. Additionally, the spectroscopic techniques derived from the combination of X-ray absorption and emission spectroscopy (XAS–XES), such as resonant inelastic X-ray scattering (RIXS) and high energy resolution fluorescence detected (HERFD) XAS, are an ideal tool for the study of nanomaterials. New installations and beamline upgrades now often include wavelength dispersive instruments for the analysis of the emitted X-rays. With the growing use of XAS–XES, scientists are learning about the possibilities and pitfalls. We discuss some experimental aspects, assess the feasibility of measuring weak fluorescence lines in dilute, radiation sensitive samples, and present new experimental approaches for studying magnetic properties of colloidal nanoparticles directly in the liquid phase.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1782156

Alternate ID(s):: OSTI ID: 1643720

Journal Information:: Nanoscale, Vol. 12, Issue 30; ISSN 2040-3364

Publisher:: Royal Society of ChemistryCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 16 works

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