Electronic Properties of Hydrogen Storage Materials with Photon-in/Photon-out Soft-X-Ray Spectroscopy
Journal Article
·
· Journal of Physics and Chemistry of Solids
The applications of resonant soft X-ray emission spectroscopy on a variety of carbon systems have yielded characteristic fingerprints. With high-resolution monochromatized synchrotron radiation excitation, resonant inelastic X-ray scattering has emerged as a new source of information about electronic structure and excitation dynamics. Photon-in/photon-out soft-X-ray spectroscopy is used to study the electronic properties of fundamental materials, nanostructure, and complex hydrides and will offer potential in-depth understanding of chemisorption and/or physisorption mechanisms of hydrogen adsorption/desorption capacity and kinetics.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- Advanced Light Source Division
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 941069
- Report Number(s):
- LBNL-1024E
- Journal Information:
- Journal of Physics and Chemistry of Solids, Journal Name: Journal of Physics and Chemistry of Solids Journal Issue: 9 Vol. 69; ISSN 0022-3697; ISSN JPCSAW
- Country of Publication:
- United States
- Language:
- English
Similar Records
Synchrotron radiation, soft-X-ray spectroscopy andnanomaterials
Soft-x-ray spectroscopy study of nanoscale materials
Applications of photon-in, photon-out spectroscopy with third-generation, synchrotron-radiation sources
Journal Article
·
Mon Sep 13 00:00:00 EDT 2004
· International Journal of Nanotechnology
·
OSTI ID:882250
Soft-x-ray spectroscopy study of nanoscale materials
Conference
·
Sat Jul 30 00:00:00 EDT 2005
·
OSTI ID:922838
Applications of photon-in, photon-out spectroscopy with third-generation, synchrotron-radiation sources
Conference
·
Mon Dec 31 23:00:00 EST 1990
·
OSTI ID:5590734