X-ray Photoelectron Spectroscopy Studies of Oxidized and Reduced Ce₀.₈Zr₀.₂O₂(111)

Journal Article · Wed Dec 01 04:00:00 EST 2004 · Surface Science Spectra

OSTI ID:877083

Azad, Samina; Engelhard, Mark H; Peden, Charles HF; Thevuthasan, Suntharampillai

We have studied the electronic structure of oxidized and reduced CeZrO(111) using x-ray photoelectron spectroscopy (XPS). The 50 nm thick CeZrO(111) film was grown on a YSZ(111) substrate using oxygen assisted molecular beam epitaxy (OPA-MBE). This film has been characterized using in-situ RHEED (reflection high energy electron diffraction) and ex-situ XRD (x-ray diffraction), HRTEM (high energy resolution transmission electron spectroscopy) and RBS (Rutherford backscattering spectroscopy). Surfaces of the Ce₀.₈Zr₀.₂O₂(111) film used in this study is found to be unreconstructed and exhibits the structure of bulk CeO₂(111) where Zr atoms occupy the lattice sites of Ce in the fluorite structure of ceria. The extent of surface reduction as a result of vacuum annealing has been reported here in addition to the electronic structure of defect-free Ce₀.₈Zr₀.₂O₂(111) surface.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 877083
• Report Number(s): PNNL-SA-44324; 1233a; KP1704020
• Journal Information: Surface Science Spectra, Journal Name: Surface Science Spectra Journal Issue: 1-4 Vol. 11; ISSN 1055-5269; ISSN SSSPEN
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANNEALING
ATOMS
BACKSCATTERING
DIFFRACTION
ELECTRON DIFFRACTION
ELECTRON SPECTROSCOPY
ELECTRONIC STRUCTURE
ENERGY RESOLUTION
Environmental Molecular Sciences Laboratory
FLUORITE
MOLECULAR BEAM EPITAXY
OXYGEN
REFLECTION
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SPECTROSCOPY
SUBSTRATES
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY