X-ray Photoelectron Spectroscopy Studies of Oxidized and Reduced CeO₂(111) Surfaces

Journal Article · Wed Dec 01 04:00:00 EST 2004 · Surface Science Spectra, 11(1-4):73-81

OSTI ID:877084

Engelhard, Mark H; Azad, Samina; Peden, Charles HF; Thevuthasan, Suntharampillai

We have studied the electronic structure of oxidized and reduced CeO₂ (111) surfaces using X-ray photoelectron spectroscopy (XPS). The 50 nm thick Co₂(111) film was grown on a YSZ(111) substrate using oxygen plasma assisted molecular beam epitaxy (OPA-MBE). This film has been characterized using in-situ RHEED (reflection high energy electron diffraction) and ex-situ XRD (X-ray diffraction), HRTEM (high resolution transmission electron microscopy) and RBS (Rutherford backscattering spectroscopy). The lattice mismatch between CeO₂(111) and YSZ(111) is less than 5% and yields a flat surface that is comprised of an equivalent number of Ce⁴⁺ and O₂₋ ions. Oxidation with O₂ at 773 K under UHV conditions was sufficient to fully oxidize the CeO₂(111). Surface reduction was carried out by annealing in UHV at 973 K.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 877084
• Report Number(s): PNNL-SA-44325; 1233a; KP1704020
• Journal Information: Surface Science Spectra, 11(1-4):73-81, Journal Name: Surface Science Spectra, 11(1-4):73-81 Journal Issue: 1-4 Vol. 11; ISSN 1055-5269; ISSN SSSPEN
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANNEALING
BACKSCATTERING
DIFFRACTION
ELECTRON DIFFRACTION
ELECTRONIC STRUCTURE
Environmental Molecular Sciences Laboratory
MOLECULAR BEAM EPITAXY
OXIDATION
OXYGEN
PLASMA
REFLECTION
RESOLUTION
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SPECTROSCOPY
SUBSTRATES
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY