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Thin-Film Design for Multilayer Diffraction Gratings

Conference · · in Laser-Induced Damage in Optical Materials: 2005, edited by G. J. Exarhos, A. H. Guenther, K. L. Lewis, D. Ristau, M. J. Soileau, and C. J. Stolz (SPIE, Bellingham, WA, 2005)
OSTI ID:876674
 [1]; ; ; ; ; ; ;
  1. Laboratory for Laser Energetis, University of Rochester, Rochester, NY

Multilayer dielectric (MLD) diffraction gratings are a key component for the construction of high-peak-power, pulse-compressed laser systems. While a great deal of effort has been devoted to the design of optimal grating structures and the etching of these structures into the MLD coating, there has not been the same effort put into the optimization of the MLD coating itself. The primary characteristics of the multilayer that must be considered during design include minimization of the standing wave created in the photoresist because of the reflectivity of the coated optical surface, creation of a sufficiently high reflectivity at the use wavelength and incidence angle in a dry environment, proper balance of the individual layer materials to yield a coating with an overall neutral or slightly compressive stress, and a high laser-damage threshold for the wavelength and pulse duration of use. This work focuses on the modification of a standard MLD mirror, while considering these characteristics, to allow the fabrication of a diffraction grating with higher efficiency and laser-damage threshold than is typically achieved.

Research Organization:
Laboratory for Laser Energetics, University of Rochester, Rochester, NY
Sponsoring Organization:
USDOE
DOE Contract Number:
FC52-92SF19460
OSTI ID:
876674
Report Number(s):
DOE/SF19460-656; 1617; 2005-79
Journal Information:
in Laser-Induced Damage in Optical Materials: 2005, edited by G. J. Exarhos, A. H. Guenther, K. L. Lewis, D. Ristau, M. J. Soileau, and C. J. Stolz (SPIE, Bellingham, WA, 2005), Journal Name: in Laser-Induced Damage in Optical Materials: 2005, edited by G. J. Exarhos, A. H. Guenther, K. L. Lewis, D. Ristau, M. J. Soileau, and C. J. Stolz (SPIE, Bellingham, WA, 2005) Vol. 59941
Country of Publication:
United States
Language:
English

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