Skip to main content
OSTI.GOVU.S. Department of Energy Office of Scientific and Technical Information
U.S. Department of Energy
Office of Scientific and Technical Information
 

Crystal phase identification

Patent ·
OSTI ID:874148
 [1];  [1];  [1]
  1. Albuquerque, NM
+ Show Author Affiliations

A method and apparatus for determining the crystalline phase and crystalline characteristics of a sample. This invention provides a method and apparatus for unambiguously identifying and determining the crystalline phase and crystalline characteristics of a sample by using an electron beam generator, such as a scanning electron microscope, to obtain a backscattered electron Kikuchi pattern of a sample, and extracting crystallographic and composition data that is matched to database information to provide a quick and automatic method to identify crystalline phases.

Research Organization:
SANDIA CORP
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Number(s):
US 6326619
OSTI ID:
874148
Country of Publication:
United States
Language:
English

References (1)

Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns journal May 1996

Similar Records

Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
Journal Article · Wed May 01 00:00:00 EDT 1996 · Journal of Research of the National Institute of Standards and Technology · OSTI ID:1628732
Development of backscattered electron Kikuchi patterns for phase identification in the SEM
Conference · Thu Nov 30 23:00:00 EST 1995 · OSTI ID:161517
Application of Electron Backscatter Diffraction to Phase Identification
Book · Wed Jul 16 00:00:00 EDT 2008 · OSTI ID:989334

Related Subjects

/250/
apparatus
automatic
backscattered
beam
characteristics
composition
crystal
crystal phase
crystalline
crystalline phase
crystallographic
data
database
determining
electron
electron beam
extracting
generator
identification
identify
identifying
information
kikuchi
matched
method
microscope
obtain
pattern
phase
phases
provide
provides
quick
sample
scanning
unambiguously