Method of making suspended thin-film semiconductor piezoelectric devices
Patent
·
OSTI ID:873737
- Albuquerque, NM
- Cedar Crest, NM
A process for forming a very thin suspended layer of piezoelectric material of thickness less than 10 microns. The device is made from a combination of GaAs and AlGaAs layers to form either a sensor or an electronic filter. Onto a GaAs substrate is epitaxially deposited a thin (1-5 micron) sacrificial AlGaAs layer, followed by a thin GaAs top layer. In one embodiment the substrate is selectively etched away from below until the AlGaAs layer is reached. Then a second selective etch removes the sacrificial AlGaAs layer, that has acted here as an etch stop, leaving the thin suspended layer of piezoelectric GaAs. In another embodiment, a pattern of small openings is etched through the thin layer of GaAs on top of the device to expose the sacrificial AlGaAs layer. A second selective etch is done through these openings to remove the sacrificial AlGaAs layer, leaving the top GaAs layer suspended over the GaAs substrate. A novel etchant solution containing a surface tension reducing agent is utilized to remove the AlGaAs while preventing buildup of gas bubbles that would otherwise break the thin GaAs layer.
- Research Organization:
- SANDIA CORP
- DOE Contract Number:
- AC04-94AL85000
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Number(s):
- US 6232139
- OSTI ID:
- 873737
- Country of Publication:
- United States
- Language:
- English
Piezoelectric photoacoustic study of Al/sub x/Ga/sub 1-x/As epitaxial layer (x=0.22, 0.28, 0.5) grown on semi-insulating GaAs substrate
|
conference | January 1998 |
X-band thin film acoustic filters on GaAs
|
journal | January 1993 |
Similar Records
Patterned nanochannel sacrificial layer for semiconductor substrate reuse
Formation of three-dimensional ZnSe-based semiconductor nanostructures
Method for forming suspended micromechanical structures
Patent
·
Mon Nov 27 23:00:00 EST 2023
·
OSTI ID:2293930
Formation of three-dimensional ZnSe-based semiconductor nanostructures
Journal Article
·
Thu Jan 14 23:00:00 EST 2010
· Semiconductors
·
OSTI ID:21562366
Method for forming suspended micromechanical structures
Patent
·
Fri Dec 31 23:00:00 EST 1999
·
OSTI ID:872838
Related Subjects
/438/
1-5
10
acted
agent
algaas
algaas layer
algaas layers
below
break
bubbles
buildup
combination
containing
deposited
device
devices
electronic
embodiment
epitaxially
epitaxially deposited
etch
etch stop
etchant
etched
expose
film semiconductor
filter
followed
form
forming
gaas
gaas layer
gaas substrate
gas
gas bubble
gas bubbles
layer
layers
leaving
material
method
micron
microns
novel
openings
otherwise
pattern
piezoelectric
piezoelectric material
preventing
process
reached
reducing
reducing agent
remove
removes
sacrificial
selective
selective etch
selectively
selectively etched
semiconductor
sensor
solution
solution containing
stop
substrate
surface
surface tension
suspended
tension
thickness
thin-film
thin-film semiconductor
top
top layer
utilized
1-5
10
acted
agent
algaas
algaas layer
algaas layers
below
break
bubbles
buildup
combination
containing
deposited
device
devices
electronic
embodiment
epitaxially
epitaxially deposited
etch
etch stop
etchant
etched
expose
film semiconductor
filter
followed
form
forming
gaas
gaas layer
gaas substrate
gas
gas bubble
gas bubbles
layer
layers
leaving
material
method
micron
microns
novel
openings
otherwise
pattern
piezoelectric
piezoelectric material
preventing
process
reached
reducing
reducing agent
remove
removes
sacrificial
selective
selective etch
selectively
selectively etched
semiconductor
sensor
solution
solution containing
stop
substrate
surface
surface tension
suspended
tension
thickness
thin-film
thin-film semiconductor
top
top layer
utilized