Electrochemical sharpening of field emission tips
Patent
·
OSTI ID:872237
- Berkeley, CA
A method for sharpening field emitter tips by electroetching/polishing. In gated field emitters, it is very important to initiate electron emission at the lowest possible voltage and thus the composition of the emitter and the gate, as well as the emitter-gate structure, are important factors. This method of sharpening the emitter tips uses the grid as a counter electrode in electroetching of the emitters, which can produce extremely sharp emitter tips as well as remove asperities and other imperfections in the emitters, each in relation to the specific grid hole in which it resides. This has the effect of making emission more uniform among the emitters as well as lowering the turn-on voltage.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Number(s):
- US 5891321
- OSTI ID:
- 872237
- Country of Publication:
- United States
- Language:
- English
Low-voltage field emission from tungsten fiber arrays in a stabilized zirconia matrix
|
journal | June 1987 |
Vacuum microelectronics-1992
|
journal | June 1992 |
The art and science and other aspects of making sharp tips
|
journal | March 1991 |
Similar Records
Electrochemical sharpening of field emission tips
Sharpening of field emitter tips using high-energy ions
Sharpening of field emitter tips using high-energy ions
Patent
·
Tue Apr 06 00:00:00 EDT 1999
·
OSTI ID:335479
Sharpening of field emitter tips using high-energy ions
Patent
·
Thu Dec 31 23:00:00 EST 1998
·
OSTI ID:872698
Sharpening of field emitter tips using high-energy ions
Patent
·
Mon Nov 29 23:00:00 EST 1999
·
OSTI ID:20013876
Related Subjects
/205/445/
asperities
composition
counter
counter electrode
effect
electrochemical
electrode
electroetching
electron
electron emission
emission
emission tips
emitter
emitter tips
emitter-gate
emitters
extremely
factors
field
field emission
field emitter
field emitters
gate
gated
gated field
grid
imperfections
initiate
initiate electron
lowering
lowest
method
polishing
produce
relation
remove
resides
sharp
sharpening
specific
structure
tips
turn-on
turn-on voltage
uniform
voltage
asperities
composition
counter
counter electrode
effect
electrochemical
electrode
electroetching
electron
electron emission
emission
emission tips
emitter
emitter tips
emitter-gate
emitters
extremely
factors
field
field emission
field emitter
field emitters
gate
gated
gated field
grid
imperfections
initiate
initiate electron
lowering
lowest
method
polishing
produce
relation
remove
resides
sharp
sharpening
specific
structure
tips
turn-on
turn-on voltage
uniform
voltage