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Scanning tip microwave near field microscope

Patent ·
OSTI ID:871898
 [1];  [2];  [3]
  1. Alameda, CA
  2. Oakland, CA
  3. Albany, CA
+ Show Author Affiliations

A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

Research Organization:
University of California
DOE Contract Number:
AC03-76SF00098
Assignee:
Regents Of University Of California (Oakland, CA)
Patent Number(s):
US 5821410
OSTI ID:
871898
Country of Publication:
United States
Language:
English

References (9)

Use of a helical resonator as a capacitive transducer in vibrating reed measurements journal September 1989
Microwave Scanning Microscopy for Planar Structure Diagnostics conference January 1987
Super-resolution Aperture Scanning Microscope journal June 1972
XXXVIII. A suggested method for extending microscopic resolution into the ultra-microscopic region journal August 1928
A Microwave Magnetic Microscope journal March 1962
Scanning electromagnetic transmission line microscope with sub-wavelength resolution journal January 1989
Noncontact Technique for the Local Measurement of Semiconductor Resistivity journal November 1965
Non-destructive characterization of materials by evanescent microwaves journal May 1993
Scanning tip microwave near‐field microscope journal June 1996

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