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Title: Scanning tip microwave near field microscope

Abstract

A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

Inventors:
 [1];  [2];  [3]
  1. Alameda, CA
  2. Oakland, CA
  3. Albany, CA
Publication Date:
Research Org.:
Univ. of California (United States)
OSTI Identifier:
871898
Patent Number(s):
US 5821410
Assignee:
Regents Of University Of California (Oakland, CA)
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
scanning; tip; microwave; near; field; microscope; novel; probe; structure; probing; evanescent; radiation; emitted; sharpened; metal; aperture; gap; electrically; mechanically; connected; central; electrode; extends; endwall; resonating; device; cavity; resonator; stripline; intensity; increases; sharpens; total; energy; radiated; absorbed; sample; result; improved; spatial; resolution; sacrificing; sensitivity; total energy; mechanically connected; spatial resolution; microwave cavity; field intensity; central electrode; near field; cavity resonator; microwave near; improved spatial; field microscope; mechanically connect; wave cavity; /73/250/

Citation Formats

Xiang, Xiao-Dong, Schultz, Peter G, and Wei, Tao. Scanning tip microwave near field microscope. United States: N. p., 1998. Web.
Xiang, Xiao-Dong, Schultz, Peter G, & Wei, Tao. Scanning tip microwave near field microscope. United States.
Xiang, Xiao-Dong, Schultz, Peter G, and Wei, Tao. 1998. "Scanning tip microwave near field microscope". United States. https://www.osti.gov/servlets/purl/871898.
@article{osti_871898,
title = {Scanning tip microwave near field microscope},
author = {Xiang, Xiao-Dong and Schultz, Peter G and Wei, Tao},
abstractNote = {A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.},
doi = {},
url = {https://www.osti.gov/biblio/871898}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {1}
}

Works referenced in this record:

Non-destructive characterization of materials by evanescent microwaves
journal, May 1993


Super-resolution Aperture Scanning Microscope
journal, June 1972


Use of a helical resonator as a capacitive transducer in vibrating reed measurements
journal, September 1989


Scanning tip microwave near‐field microscope
journal, June 1996


Microwave Scanning Microscopy for Planar Structure Diagnostics
conference, January 1987


XXXVIII. A suggested method for extending microscopic resolution into the ultra-microscopic region
journal, August 1928


A Microwave Magnetic Microscope
journal, March 1962


Noncontact Technique for the Local Measurement of Semiconductor Resistivity
journal, November 1965


Scanning electromagnetic transmission line microscope with sub-wavelength resolution
journal, January 1989