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Scanning tip microwave near field microscope

Patent ·
OSTI ID:675813
A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an end wall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity. 17 figs.
Research Organization:
University of California
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC03-76SF00098
Assignee:
Univ. Of California, Oakland, CA (United States)
Patent Number(s):
US 5,821,410/A/
Application Number:
PAN: 8-717,321
OSTI ID:
675813
Country of Publication:
United States
Language:
English

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