Static ferroelectric memory transistor having improved data retention
Patent
·
OSTI ID:870703
- 7716 Wm. Moyers Ave., NE., Albuquerque, NM 87112
- 12808 Lillian Pl., NE., Albuquerque, NM 87112
An improved ferroelectric FET structure in which the ferroelectric layer is doped to reduce retention loss. A ferroelectric FET according to the present invention includes a semiconductor layer having first and second contacts thereon, the first and second contacts being separated from one another. The ferroelectric FET also includes a bottom electrode and a ferroelectric layer which is sandwiched between the semiconductor layer and the bottom electrode. The ferroelectric layer is constructed from a perovskite structure of the chemical composition ABO.sub.3 wherein the B site comprises first and second elements and a dopant element that has an oxidation state greater than +4 in sufficient concentration to impede shifts in the resistance measured between the first and second contacts with time. The ferroelectric FET structure preferably comprises Pb in the A-site. The first and second elements are preferably Zr and Ti, respectively. The preferred B-site dopants are Niobium, Tantalum, and Tungsten at concentrations between 1% and 8%.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA
- Assignee:
- Evans, Jr., Joseph T. (13609 Verbena Pl., N.E., Albuquerque, NM 87112);Warren, William L. (7716 Wm. Moyers Ave., NE., Albuquerque, NM 87112);Tuttle, Bruce A. (12808 Lillian Pl., NE., Albuquerque, NM 87112)
- Patent Number(s):
- US 5578846
- OSTI ID:
- 870703
- Country of Publication:
- United States
- Language:
- English
Similar Records
Ferroelectric capacitor with reduced imprint
Steep slope transistors with threshold switching devices
III-V group compound semiconductor light-emitting element having a doped tantalum barrier layer
Patent
·
Tue Dec 31 23:00:00 EST 1996
·
OSTI ID:871185
Steep slope transistors with threshold switching devices
Patent
·
Mon Nov 29 23:00:00 EST 2021
·
OSTI ID:1860130
III-V group compound semiconductor light-emitting element having a doped tantalum barrier layer
Patent
·
Tue May 08 00:00:00 EDT 1984
·
OSTI ID:6316995
Related Subjects
/257/
a-site
according
b-site
bottom
bottom electrode
chemical
chemical composition
composition
comprises
concentration
concentrations
constructed
contacts
data
dopant
dopant element
dopants
doped
electrode
element
elements
ferroelectric
ferroelectric fet
ferroelectric layer
ferroelectric memory
fet
impede
improved
improved data
improved ferroelectric
layer
loss
measured
memory
memory transistor
niobium
oxidation
pb
perovskite
perovskite structure
preferably
preferably comprise
preferably comprises
preferred
reduce
resistance
resistance measured
respectively
retention
sandwiched
semiconductor
semiconductor layer
separated
shifts
site
site comprises
static
structure
structure preferably
sufficient
sufficient concentration
tantalum
thereon
time
transistor
tungsten
zr
a-site
according
b-site
bottom
bottom electrode
chemical
chemical composition
composition
comprises
concentration
concentrations
constructed
contacts
data
dopant
dopant element
dopants
doped
electrode
element
elements
ferroelectric
ferroelectric fet
ferroelectric layer
ferroelectric memory
fet
impede
improved
improved data
improved ferroelectric
layer
loss
measured
memory
memory transistor
niobium
oxidation
pb
perovskite
perovskite structure
preferably
preferably comprise
preferably comprises
preferred
reduce
resistance
resistance measured
respectively
retention
sandwiched
semiconductor
semiconductor layer
separated
shifts
site
site comprises
static
structure
structure preferably
sufficient
sufficient concentration
tantalum
thereon
time
transistor
tungsten
zr