Ultrafast scanning probe microscopy

Patent · Sat Dec 31 23:00:00 EST 1994

OSTI ID:869883

Weiss, Shimon ^[1]; Chemla, Daniel S ^[2]; Ogletree, D Frank ^[1]; Botkin, David ^[3]

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1. El Cerrito, CA
2. Kensington, CA
3. San Francisco, CA

An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

• Research Organization: UNIVERSITY OF CALIFORNIA
• DOE Contract Number: AC03-76SF00098
• Assignee: Regents of University of California (Oakland, CA)
• Patent Number(s): US 5416327
• OSTI ID: 869883
• Country of Publication: United States
• Language: English

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