Ultrafast scanning probe microscopy

Patent · Sun Jan 01 00:00:00 EST 1995

OSTI ID:869883

Weiss, Shimon ^[1]; Chemla, Daniel S ^[2]; Ogletree, D Frank ^[1]; Botkin, David ^[3]

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1. El Cerrito, CA
2. Kensington, CA
3. San Francisco, CA

An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

• Research Organization: Univ. of California (United States)
• DOE Contract Number: AC03-76SF00098
• Assignee: Regents of University of California (Oakland, CA)
• Patent Number(s): US 5416327
• OSTI ID: 869883
• Country of Publication: United States
• Language: English

Related Subjects

ultrafast
scanning
probe
microscopy
method
achieving
subpicosecond-temporal
resolution
submicron-spatial
observation
sample
embodiment
claimed
single
optical
pulse
generated
split
pulses
delayed
variable
time
delay
means
directed
located
proximate
microscope
produces
probe-sample
signals
indicative
response
characteristics
modulate
varied
signal
recorded
various
delays
created
plotted
function
produce
cross-correlation
provides
simultaneous
response signal
signals indicative
time delays
optical pulse
sample signal
time delay
spatial resolution
scanning probe
microscopy method
located proximate
probe microscope
probe microscopy
sample located
provides simultaneous
ultrafast scanning
temporal resolution
various time
probe sample
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