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Title: Deposition of device quality low H content, amorphous silicon films

Abstract

A high quality, low hydrogen content, hydrogenated amorphous silicon (a-Si:H) film is deposited by passing a stream of silane gas (SiH.sub.4) over a high temperature, 2000.degree. C., tungsten (W) filament in the proximity of a high temperature, 400.degree. C., substrate within a low pressure, 8 mTorr, deposition chamber. The silane gas is decomposed into atomic hydrogen and silicon, which in turn collides preferably not more than 20-30 times before being deposited on the hot substrate. The hydrogenated amorphous silicon films thus produced have only about one atomic percent hydrogen, yet have device quality electrical, chemical, and structural properties, despite this lowered hydrogen content.

Inventors:
 [1];  [2];  [3]
  1. Golden, CO
  2. Evergreen, CO
  3. Louisville, CO
Publication Date:
Research Org.:
Midwest Research Institute, Kansas City, MO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
869789
Patent Number(s):
US 5397737
Assignee:
United States of America as represented by United States (Washington, DC)
DOE Contract Number:  
AC02-83CH10093
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
deposition; device; quality; content; amorphous; silicon; films; hydrogen; hydrogenated; a-si; film; deposited; passing; stream; silane; gas; sih; temperature; 2000; degree; tungsten; filament; proximity; 400; substrate; pressure; mtorr; chamber; decomposed; atomic; collides; preferably; 20-30; times; hot; produced; percent; electrical; chemical; structural; properties; despite; lowered; silicon films; hydrogen content; atomic hydrogen; silicon film; device quality; atomic percent; deposition chamber; amorphous silicon; hydrogenated amorphous; silane gas; structural properties; /438/136/427/

Citation Formats

Mahan, Archie H, Carapella, Jeffrey C, and Gallagher, Alan C. Deposition of device quality low H content, amorphous silicon films. United States: N. p., 1995. Web.
Mahan, Archie H, Carapella, Jeffrey C, & Gallagher, Alan C. Deposition of device quality low H content, amorphous silicon films. United States.
Mahan, Archie H, Carapella, Jeffrey C, and Gallagher, Alan C. Sun . "Deposition of device quality low H content, amorphous silicon films". United States. https://www.osti.gov/servlets/purl/869789.
@article{osti_869789,
title = {Deposition of device quality low H content, amorphous silicon films},
author = {Mahan, Archie H and Carapella, Jeffrey C and Gallagher, Alan C},
abstractNote = {A high quality, low hydrogen content, hydrogenated amorphous silicon (a-Si:H) film is deposited by passing a stream of silane gas (SiH.sub.4) over a high temperature, 2000.degree. C., tungsten (W) filament in the proximity of a high temperature, 400.degree. C., substrate within a low pressure, 8 mTorr, deposition chamber. The silane gas is decomposed into atomic hydrogen and silicon, which in turn collides preferably not more than 20-30 times before being deposited on the hot substrate. The hydrogenated amorphous silicon films thus produced have only about one atomic percent hydrogen, yet have device quality electrical, chemical, and structural properties, despite this lowered hydrogen content.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}

Patent:

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