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U.S. Department of Energy
Office of Scientific and Technical Information

Method for forming silicon on a glass substrate

Patent ·
OSTI ID:869770

A method by which single-crystal silicon microelectronics may be fabricated on glass substrates at unconventionally low temperatures. This is achieved by fabricating a thin film of silicon on glass and subsequently forming the doped components by a short wavelength (excimer) laser doping procedure and conventional patterning techniques. This method may include introducing a heavily boron doped etch stop layer on a silicon wafer using an excimer laser, which permits good control of the etch stop layer removal process. This method additionally includes dramatically reducing the remaining surface roughness of the silicon thin films after etching in the fabrication of silicon on insulator wafers by scanning an excimer laser across the surface of the silicon thin film causing surface melting, whereby the surface tension of the melt causes smoothing of the surface during recrystallization. Applications for this method include those requiring a transparent or insulating substrate, such as display manufacturing. Other applications include sensors, actuators, optoelectronics, radiation hard and high temperature electronics.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA
DOE Contract Number:
W-7405-ENG-48
Assignee:
Regents of University of California (Oakland, CA)
Patent Number(s):
US 5395481
OSTI ID:
869770
Country of Publication:
United States
Language:
English

References (6)

Low-temperature fabrication of p/sup +/-n diodes with 300-AA junction depth journal July 1992
Laser crystallization of Si films on glass journal March 1982
Nanosecond Thermal Processing for Ultra-High-Speed Device Technology journal January 1989
Novel LSI/SOI wafer fabrication using device layer transfer technique conference January 1985
A technology for high-performance single-crystal silicon-on-insulator transistors journal April 1987
Silicon-on-insulator (SOI) by bonding and ETCH-back conference January 1985