Apparatus and method for measuring and imaging surface resistance

Martens, Jon S; Hietala, Vincent M; Hohenwarter, Gert K. G.

Apparatus and method for measuring and imaging surface resistance

Patent · Thu Dec 31 23:00:00 EST 1992

OSTI ID:868897

Martens, Jon S ^[1]; Hietala, Vincent M ^[2]; Hohenwarter, Gert K. G. ^[3]

Albuquerque, NM
Placitas, NM
Madison, WI

Apparatus and method for determining and imaging superconductor surface resistance. The apparatus comprises modified Gaussian confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor.

Assignee:: United States of America as represented by United States (Washington, DC)

Patent Number(s):: US 5239269

Application Number:: 07/789,225

OSTI ID:: 868897

Country of Publication:: United States

Language:: English

References (7)

Microwave surface resistance of YBa ₂ Cu ₃ O _6.9 superconducting films Martens, J. S.; Beyer, J. B.; Ginley, D. S. Applied Physics Letters, Vol. 52, Issue 21 https://doi.org/10.1063/1.99726	journal	May 1988
Infrared and Optical Masers Schawlow, A. L.; Townes, C. H. Physical Review, Vol. 112, Issue 6 https://doi.org/10.1103/PhysRev.112.1940	journal	December 1958
The effects of processing sequences on the microwave surface resistance of TlCaBaCuO Martens, J. S.; Zipperian, T. E.; Ginley, D. S. Journal of Applied Physics, Vol. 69, Issue 12 https://doi.org/10.1063/1.347434	journal	June 1991
On the Focused Fabry-Perot Resonator in Plasma Diagnostics (Correspondence) Lonngren, K. E.; Mink, J. W.; Beyer, J. B. IEEE Transactions on Microwave Theory and Techniques, Vol. 12, Issue 5 https://doi.org/10.1109/TMTT.1964.1125873	journal	September 1964
The role of low temperatures in the operation of logic circuitry Keyes, R. W.; Harris, E. P.; Konnerth, K. L. Proceedings of the IEEE, Vol. 58, Issue 12 https://doi.org/10.1109/PROC.1970.8063	journal	January 1970
Confocal resonators for measuring the surface resistance of high‐temperature superconducting films Martens, J. S.; Hietala, V. M.; Ginley, D. S. Applied Physics Letters, Vol. 58, Issue 22 https://doi.org/10.1063/1.104821	journal	June 1991
Morphology control and high critical currents in superconducting thin films in the Tl-Ca-Ba-Cu-O system Ginley, D. S.; Kwak, J. F.; Venturini, E. L. Physica C: Superconductivity, Vol. 160, Issue 1 https://doi.org/10.1016/0921-4534(89)90450-4	journal	August 1989

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/324/
analyzing
anomalies
apparatus
apparatus comprise
apparatus comprises
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confocal
confocal resonator
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determining
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impurities
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microwaves
mirror
modified
non-stoichiometry
radiating
reflected
reflected microwave
remote
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resonator
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sample
sample remote
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Apparatus and method for measuring and imaging surface resistance

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References (7)

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