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Lens system for a photo ion spectrometer

Patent ·
OSTI ID:867618
 [1];  [2];  [3]
  1. Downers Grove, IL
  2. Westmont, IL
  3. Napersville, IL
+ Show Author Affiliations

A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL
DOE Contract Number:
W-31109-ENG-38
Assignee:
Arch Development Corp. (Chicago, IL)
Patent Number(s):
US 4973842
OSTI ID:
867618
Country of Publication:
United States
Language:
English

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Related Subjects

/250/
analysis
atomic
atomic component
atomic components
beam
coatings
component
components
extracted
ionization
ionized
ionized atomic
lens
manipulating
photo
primary
protecting
removed
resistant
resistant coating
resistant coatings
sample
spectrometer