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Lens system for a photo ion spectrometer

Patent ·
OSTI ID:7266569

A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs.

DOE Contract Number:
W-31109-ENG-38
Assignee:
Arch Development Corp., Chicago, IL (United States)
Patent Number(s):
US 4973842; A
Application Number:
PPN: US 7-045587
OSTI ID:
7266569
Country of Publication:
United States
Language:
English

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