Lens system for a photo ion spectrometer

Patent · Tue Nov 27 00:00:00 EST 1990

OSTI ID:7266569

Gruen, D M; Young, C E; Pellin, M J

A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs.

• DOE Contract Number: W-31109-ENG-38
• Assignee: Arch Development Corp., Chicago, IL (United States)
• Patent Number(s): US 4973842; A
• Application Number: PPN: US 7-045587
• OSTI ID: 7266569
• Resource Relation: Patent File Date: 4 May 1987
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
LENSES
DESIGN
SPECTROMETERS
ION BEAMS
PROTECTIVE COATINGS
BEAMS
COATINGS
MEASURING INSTRUMENTS
430303* - Particle Accelerators- Experimental Facilities & Equipment