Photo ion spectrometer

Patent · Sat Dec 31 23:00:00 EST 1988

OSTI ID:867227

Gruen, Dieter M ^[1]; Young, Charles E ^[2]; Pellin, Michael J ^[3]

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1. Downers Grove, IL
2. Westmont, IL
3. Naperville, IL

A charged particle spectrometer for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• Assignee: ARCH Development Corporation (Chicago, IL)
• Patent Number(s): US 4889987
• OSTI ID: 867227
• Country of Publication: United States
• Language: English

Related Subjects

/250/
accomplished
accumulation
allow
amplifier
analysis
angular
atomic
atomic component
atomic components
boundary
boundary conditions
charge
charge amplifier
charged
charged particle
chemical
chemical information
comparison
component
components
conditions
counting
described
dimensional
dimensional structure
directly
eartof
electromagnetic
electromagnetic field
electronic
enables
energy
field
field boundary
generating
generating predetermined
improvements
increased
information
ionization
ionization mode
level
level signal
magnetic field
means
mode
multiplexed
neutral
neutral atom
non-resonance
operation
particle
performing
photo
predetermined
pulse
pulse counting
quantitative
quantitative analysis
recorder
refocusing
removed
resonance
resonance ionization
sample
secondary
selected
selected atom
selected atomic
signal
signal pulse
signals
significant
significant improvement
sims
spectrometer
spectroscopy
structure
switching
transient
ultrasensitive