Photo ion spectrometer

Patent · Sun Jan 01 00:00:00 EST 1989

OSTI ID:867227

Gruen, Dieter M ^[1]; Young, Charles E ^[2]; Pellin, Michael J ^[3]

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1. Downers Grove, IL
2. Westmont, IL
3. Naperville, IL

A charged particle spectrometer for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• DOE Contract Number: W-31109-ENG-38
• Assignee: ARCH Development Corporation (Chicago, IL)
• Patent Number(s): US 4889987
• OSTI ID: 867227
• Country of Publication: United States
• Language: English

Related Subjects

photo
spectrometer
charged
particle
performing
ultrasensitive
quantitative
analysis
selected
atomic
components
removed
sample
significant
improvements
energy
angular
refocusing
spectroscopy
accomplished
means
dimensional
structure
generating
predetermined
electromagnetic
field
boundary
conditions
resonance
non-resonance
ionization
neutral
allow
accumulation
increased
chemical
information
multiplexed
operation
sims
mode
component
eartof
enables
comparison
secondary
electronic
described
switching
level
signals
directly
transient
recorder
charge
amplifier
signal
pulse
counting
charge amplifier
resonance ionization
selected atomic
level signal
quantitative analysis
electromagnetic field
magnetic field
charged particle
atomic components
pulse counting
atomic component
chemical information
significant improvement
signal pulse
field boundary
boundary conditions
ionization mode
neutral atom
dimensional structure
generating predetermined
selected atom
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