skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Photo ion spectrometer

Abstract

A charged particle spectrometer is described for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode. 12 figs.

Inventors:
; ;
Publication Date:
OSTI Identifier:
7018175
Patent Number(s):
US 4889987; A
Application Number:
PPN: US 7-014332
Assignee:
ARCH Development Corp., Chicago, IL (United States) PTO; EDB-94-118362
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 13 Feb 1987
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; ION PROBES; DESIGN; MASS SPECTROMETERS; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; QUANTITATIVE CHEMICAL ANALYSIS; CHEMICAL ANALYSIS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; PROBES; SPECTROMETERS; SPECTROSCOPY; 440800* - Miscellaneous Instrumentation- (1990-)

Citation Formats

Gruen, D.M., Young, C.E., and Pellin, M.J. Photo ion spectrometer. United States: N. p., 1989. Web.
Gruen, D.M., Young, C.E., & Pellin, M.J. Photo ion spectrometer. United States.
Gruen, D.M., Young, C.E., and Pellin, M.J. Tue . "Photo ion spectrometer". United States.
@article{osti_7018175,
title = {Photo ion spectrometer},
author = {Gruen, D.M. and Young, C.E. and Pellin, M.J.},
abstractNote = {A charged particle spectrometer is described for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode. 12 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 26 00:00:00 EST 1989},
month = {Tue Dec 26 00:00:00 EST 1989}
}