Photo ion spectrometer
A charged particle spectrometer is described for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode. 12 figs.
- DOE Contract Number:
- W-31109-ENG-38
- Assignee:
- ARCH Development Corp., Chicago, IL (United States)
- Patent Number(s):
- A; US 4889987
- Application Number:
- PPN: US 7-014332
- OSTI ID:
- 7018175
- Country of Publication:
- United States
- Language:
- English
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Photo ion spectrometer
Photo ion spectrometer